Optimisation of single La2Zr2O7 buffer layers for YBCO coated conductors prepared by chemical solution deposition

被引:28
作者
Engel, S. [1 ,2 ]
Huehne, R. [1 ]
Knoth, K. [1 ]
Chopra, A. [4 ]
Kumar, N. H. [4 ]
Sarma, V. S. [3 ]
Santhosh, P. N. [4 ]
Schultz, L. [1 ,2 ]
Holzapfel, B. [1 ]
机构
[1] IFW Dresden, D-01171 Dresden, Germany
[2] Tech Univ Dresden, Inst Mat Sci, Dept Mech Engn, D-01062 Dresden, Germany
[3] Indian Inst Technol, Dept Met & Mat Engn, Madras 600036, Tamil Nadu, India
[4] Indian Inst Technol, Dept Phys, Madras 600036, Tamil Nadu, India
关键词
characterisation; chemical solution deposition; pulsed laser deposition; oxides; oxide superconducting materials;
D O I
10.1016/j.jcrysgro.2008.07.008
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
La2Zr2O7 (LZO) buffer layers have been prepared on Ni-5 at%W tapes using chemical solution deposition. The local texture of the deposited layers has been studied throughout the thickness using ion-beam sputtering and electron back-scattering diffraction (EBSD). The processing conditions have been optimised afterwards based on these results leading to a highly textured surface for annealing temperatures of 1050 degrees C. YBa2CU3O7-x, layers were deposited by pulsed laser deposition on these single LZO buffer layers and studied in detail using X-ray diffraction and EBSD. A close correlation was found between the surface texture and the superconducting properties. (C) 2008 Elsevier B.V. All rights reserved.
引用
收藏
页码:4295 / 4300
页数:6
相关论文
共 21 条
[1]   Solution-derived textured oxide thin films - a review [J].
Bhuiyan, MS ;
Paranthaman, M ;
Salama, K .
SUPERCONDUCTOR SCIENCE & TECHNOLOGY, 2006, 19 (02) :R1-R21
[2]   Reflection high-energy electron diffraction experimental analysis of polycrystalline MgO films with grain size and orientation distributions [J].
Brewer, RT ;
Atwater, HA ;
Groves, JR ;
Arendt, PN .
JOURNAL OF APPLIED PHYSICS, 2003, 93 (01) :205-210
[3]   La2Zr2O7 single buffer layer for YBCO RABiTS coated conductors [J].
Caroff, T. ;
Morlens, S. ;
Abrutis, A. ;
Decroux, M. ;
Chaudouet, P. ;
Porcar, L. ;
Saltyte, Z. ;
Jimenez, C. ;
Odier, P. ;
Weiss, F. .
SUPERCONDUCTOR SCIENCE & TECHNOLOGY, 2008, 21 (07)
[4]   Growth mechanism, microstructure, and surface modification of nanostructured CeO2 films by chemical solution deposition [J].
Cavallaro, Andrea ;
Sandiumenge, Felip ;
Gazquez, Jaume ;
Puig, Teresa ;
Obradors, Xavier ;
Arbiol, Jordi ;
Freyhardt, Herbert C. .
ADVANCED FUNCTIONAL MATERIALS, 2006, 16 (10) :1363-1372
[5]   Fabrication of La2Zr2O7 buffer layers on Ni tapes by reel-to-reel sol-gel technique [J].
Celik, E ;
Akin, Y ;
Sigmund, W ;
Hascicek, YS .
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 2004, 106 (02) :182-190
[6]   Epitaxial growth of La2Zr2O7 thin films on rolled Ni-substrates by sol-gel process for high Tc superconducting tapes [J].
Chirayil, TG ;
Paranthaman, M ;
Beach, DB ;
Lee, DF ;
Goyal, A ;
Williams, RK ;
Cui, X ;
Kroeger, DM ;
Feenstra, R ;
Verebelyi, DT ;
Christen, DK .
PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS, 2000, 336 (1-2) :63-69
[7]   ORIENTATION DEPENDENCE OF GRAIN-BOUNDARY CRITICAL CURRENTS IN YBA2CU3O7-DELTA BICRYSTALS [J].
DIMOS, D ;
CHAUDHARI, P ;
MANNHART, J ;
LEGOUES, FK .
PHYSICAL REVIEW LETTERS, 1988, 61 (02) :219-222
[8]   Highly cube textured Ni-W-RABiTS tapes for YBCO coated conductors [J].
Eickemeyer, J ;
Selbmann, D ;
Opitz, R ;
Wendrock, H ;
Maher, E ;
Miller, U ;
Prusseit, W .
PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS, 2002, 372 (PART 2) :814-817
[9]   Nickel-refractory metal substrate tapes with high cube texture stability [J].
Eickemeyer, J ;
Selbmann, D ;
Opitz, R ;
de Boer, B ;
Holzapfel, B ;
Schultz, L ;
Miller, U .
SUPERCONDUCTOR SCIENCE & TECHNOLOGY, 2001, 14 (03) :152-159
[10]   An all chemical solution deposition approach for the growth of highly textured CeO2 cap layers on La2Zr2O7-buffered long lengths of biaxially textured Ni-W substrates for YBCO-coated conductors [J].
Engel, S ;
Knoth, K ;
Hühne, R ;
Schultz, L ;
Holzapfel, B .
SUPERCONDUCTOR SCIENCE & TECHNOLOGY, 2005, 18 (10) :1385-1390