Effect of Annealing Temperature on the Morphology and Piezoresponse Characterisation of Poly(vinylidene fluoride-trifluoroethylene) Films via Scanning Probe Microscopy

被引：44
作者：
Lau, K. [1 ]
Liu, Y. [1 ]
Chen, H. [2 ]
Withers, R. L. [1 ]
机构：
[1] Australian Natl Univ, Res Sch Chem, Canberra, ACT 0200, Australia
[2] Australian Natl Univ, Ctr Adv Microscopy, Canberra, ACT 0200, Australia
来源：
ADVANCES IN CONDENSED MATTER PHYSICS | 2013年 / 2013卷
基金：
澳大利亚研究理事会;
关键词：
THIN-FILMS; ORIENTATION; MODE;
D O I：
10.1155/2013/435938
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
Poly(vinylidene fluoride-trifluoroethylene) (PVDF-TrFE (70/30)) films were synthesized on a gold/glass substrate via spin coating. The films were annealed at a temperature between 125 degrees C and 180 degrees C. Nanoscale characterisation of the morphology, polarization switching, and local piezoresponse hysteresis loops of PVDF-TrFE film was studied using a scanning probe microscope (SPM). Ferroelectric switchable domains were identified by piezoresponse force microscopy (PFM) for all films. Small grains, with weak piezoresponse character, were observed for films annealed just above the Curie temperature. Acicular grains were obtained when the annealing temperature approached the melting point and the piezoresponse increased. Annealing above the melting point decreased the piezoresponse and the morphology changed dramatically into plate-like structures.
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页数：5
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