A New Physical Unclonable Functions Based on Measuring Power Distribution System Resistance Variations

被引：0

作者：

Zhang, JianRui ^{[1
]}

Xue, JianFeng ^{[1
]}

机构：

[1] N China Inst Aerosp Engn, Dept Elect Engn, Langfang, Peoples R China

来源：

2012 INTERNATIONAL CONFERENCE ON ANTI-COUNTERFEITING, SECURITY AND IDENTIFICATION (ASID) | 2012年

关键词：

PUF; hardware security; PDS; resistantce variations;

D O I：

暂无

中图分类号：

TP301 [理论、方法];

学科分类号：

081202 ;

摘要：

Metal resistance variations in back-end-of-line processes can be significant, particularly during process bring-up. In this paper, I propose a simple method to measure resistance variations in the Power Distribution System (PDS) of an IC, and describe how these measurements can be applied to a Physical Unclonable Function (PUF). By applying a sequence of tests using small on-chip support circuits attached to the PDS, the resistance of components of the PDS can be obtained from the solution to a set of simultaneous equations, and be applied to hardware security by forming a PUF. We demonstrate that this PUF signature can then be used to uniquely identify each IC.

引用

页数：3

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