Edge detection on eddy current image to increase defect characterization

被引：0
|
作者：
Benoist, B [1 ]
Attaoui, P [1 ]
La, R [1 ]
Lengelle, R [1 ]
Gaillard, P [1 ]
Reuchet, J [1 ]
机构：
[1] CEA SACLAY,CEREM,STA,F-91191 GIF SUR YVETTE,FRANCE
来源：
REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION, VOLS 15A AND 15B | 1996年 / 15卷
关键词：
D O I：
暂无
中图分类号：
TH [机械、仪表工业];
学科分类号：
0802 ;
摘要：
引用
收藏
页码：829 / 836
页数：8
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