A Stacked Transistors CMOS SOI Power Amplifier For 5G Applications

被引:3
作者
Ma, Zhize [1 ]
Conrad, Nathan J. [1 ]
Mohammadi, Saeed [1 ]
机构
[1] Purdue Univ, Elmore Family Sch Elect & Comp Engn, W Lafayette, IN 47907 USA
来源
2022 IEEE 22ND TOPICAL MEETING ON SILICON MONOLITHIC INTEGRATED CIRCUITS IN RF SYSTEMS (SIRF) | 2022年
关键词
5G; CMOS; RF power amplifier; SOI; Stacked transistors;
D O I
10.1109/SiRF53094.2022.9720046
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A fifth-generation (5G) radio frequency power amplifier (PA) implemented in 45nm COMS SOI technology is presented. The design is based on a stack of six transistors divided into two cells, each with a common source and two common gate stages. The layouts of the three transistors in each cell are combined to reduce parasitic capacitances and improve the PA performance. Under 4.8 V power supply (0.8 V per transistor) and at the operating frequency of 23 GHz, the CMOS PA achieves a saturated output power (PSAT) of 18.2 dBm, a -1dB output compression power (P1dB) of 16.74 dBm and a power gain of 13.1 dB with a peak power-added efficiency (PAE) and drain efficiency (DE) of 33.9% and 40.1%, respectively. Under a larger bias voltage of 6 V (1 V per transistor), PSAT increases to 19.41 dBm while peak PAE and DE slightly reduce to 23.5% and 26.8%, respectively.
引用
收藏
页码:1 / 4
页数:4
相关论文
共 5 条
[1]   High-Efficiency Microwave and mm-Wave Stacked Cell CMOS SOI Power Amplifiers [J].
Helmi, Sultan R. ;
Chen, Jing-Hwa ;
Mohammadi, Saeed .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2016, 64 (07) :2025-2038
[2]   Multigate-Cell Stacked FET Design for Millimeter-Wave CMOS Power Amplifiers [J].
Jayamon, Jefy A. ;
Buckwalter, James F. ;
Asbeck, Peter M. .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2016, 51 (09) :2027-2039
[3]  
Lin JL, 2017, IEEE MTT S INT MICR, P31, DOI 10.1109/MWSYM.2017.8059113
[4]  
Shakib S, 2017, ISSCC DIG TECH PAP I, P44, DOI 10.1109/ISSCC.2017.7870252
[5]   A Highly Efficient and Linear Power Amplifier for 28-GHz 5G Phased Array Radios in 28-nm CMOS [J].
Shakib, Sherif ;
Park, Hyun-Chul ;
Dunworth, Jeremy ;
Aparin, Vladimir ;
Entesari, Kamran .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2016, 51 (12) :3020-3036