Thermal Nonlinearities in Contour Mode AlN Resonators

被引:32
作者
Segovia-Fernandez, Jeronimo [1 ]
Piazza, Gianluca [1 ]
机构
[1] Carnegie Mellon Univ, Dept Elect & Comp Engn, Pittsburgh, PA 15213 USA
关键词
Amplitude-frequency; contour mode AlN resonator; duffing equation; lumped electrical mode; thermal nonlinear effect; third-order intermodulation distortion;
D O I
10.1109/JMEMS.2013.2252422
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper, we analyze the origin of elastic nonlinearities in aluminium nitride contour mode resonators (CMRs). Our study highlights that the nonlinear behavior is due to thermal effects when the resonators are electrically excited and the input is slowly (slow with respect to the device thermal time constant) swept through the excitation frequencies close to the main resonance. An analytical expression that relates the nonlinear behavior of the device to its geometry and material properties is derived. Amplitude-frequency (A-f) and third-order intermodulation (IMD3) measurements on 1-GHz AlN CMRs are employed to demonstrate the theoretical reasoning. The two experiments confirm the validity of the analytical derivation when the system is dominated by thermally induced nonlinearities. In the case of large frequency difference between the modulation frequencies, purely elastic nonlinearity can also be extracted from the IMD3 measurements. [2012-0264]
引用
收藏
页码:976 / 985
页数:10
相关论文
共 24 条
[1]  
Agarwal M, 2005, INT EL DEVICES MEET, P295
[2]  
Aissi M., 2006, 2006 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium (IEEE Cat. No. 06CH37741)
[3]  
Bongsang Kim, 2010, 2010 International Ultrasonics Symposium, P974, DOI 10.1109/ULTSYM.2010.0248
[4]   Nonlinear Distributed Model for Bulk Acoustic Wave Resonators [J].
Collado, Carlos ;
Rocas, Eduard ;
Mateu, Jordi ;
Padilla, Alberto ;
O'Callaghan, Juan M. .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2009, 57 (12) :3019-3029
[5]   Linear and nonlinear tuning of parametrically excited MEMS oscillators [J].
DeMartini, Barry E. ;
Rhoads, Jeffrey F. ;
Turner, Kimberly L. ;
Shaw, Steven W. ;
Moehlis, Jeff .
JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, 2007, 16 (02) :310-318
[6]  
Fedder G. K., 1998, TRIBOLOGY ISSUES OPP, P17
[7]  
Feld David A., 2009, 2009 IEEE International Ultrasonics Symposium, P1082, DOI 10.1109/ULTSYM.2009.5441599
[8]   Poly-SiGe-Based MEMS Thin-Film Encapsulation [J].
Guo, Bin ;
Wang, Bo ;
Wen, Lianggong ;
Helin, Philippe ;
Claes, Gert ;
De Coster, Jeroen ;
Du Bois, Bert ;
Verbist, Agnes ;
Van Hoof, Rita ;
Vereecke, Guy ;
Haspeslagh, Luc ;
Tilmans, Harrie A. C. ;
Decoutere, Stefaan ;
Osman, Haris ;
Puers, Robert ;
De Wolf, Ingrid ;
Tanaka, Shuji ;
Severi, Simone ;
Witvrouw, Ann .
JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, 2012, 21 (01) :110-120
[9]  
Huang WL, 2008, PROC IEEE MICR ELECT, P10
[10]   Nonlinear limits for single-crystal silicon microresonators [J].
Kaajakari, V ;
Mattila, T ;
Oja, A ;
Seppä, H .
JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, 2004, 13 (05) :715-724