Refinement of the kaolinite structure from single-crystal synchrotron data

被引:163
作者
Neder, RB
Burghammer, M
Grasl, T
Schulz, H
Bram, A
Fiedler, S
机构
[1] Inst Kristallog, D-80333 Munich, Germany
[2] European Synchrotron Radiat Facil, F-38043 Grenoble, France
关键词
crystal structure; diffuse scattering; H-positions; kaolinite; microcrystal; single crystal refinement; synchrotron radiation;
D O I
10.1346/CCMN.1999.0470411
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The crystal structure of single crystals of kaolinite from Keokuk, Iowa, was refined using data measured at the microfocus X-ray beamline at the ESRF Grenoble, France (lambda = 0.6883, T = room temperature). The volume of the crystals was 8 and 0.8 mu m(3), respectively. Unit-cell parameters are: a = 5.154(9) Angstrom, b = 8.942(4) Angstrom, c = 7.401(10) Angstrom, alpha = 91.69(9)degrees, beta = 104.61(5)degrees, gamma = 89.82(4)degrees. Space group Cl is consistent with the observed data. All non-hydrogen atoms were independently refined with anisotropic displacement parameters. The positions and isotropic displacement parameters for the three interlayer H atoms were refined also. The position of the intralayer H was found by difference-Fourier methods, although refinement was not possible. Difference-Fourier maps suggested large anisotropic displacement vectors of this intralayer H, however, no evidence for a second maximum was found. The diffraction patterns show diffuse scattering in streaks parallel to [001]* through hkl reflections with hk not equal 0, which is caused by stacking faults. No twinning was observed for either of the two crystals.
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页码:487 / 494
页数:8
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