Semianalytical Model of the Subthreshold Current in Short-Channel Junctionless Symmetric Double-Gate Field-Effect Transistors

被引:102
作者
Gnudi, Antonio [1 ]
Reggiani, Susanna [1 ]
Gnani, Elena [1 ]
Baccarani, Giorgio [1 ]
机构
[1] Univ Bologna, Adv Res Ctr Elect Syst, I-40122 Bologna, Italy
关键词
Depletion-mode field-effect transistor (FET); double-gate field-effect transistor (DG FET); drain-induced barrier lowering (DIBL); inverse subthreshold slope (SS); junctionless field-effect transistor (JL FET); THRESHOLD VOLTAGE MODEL; PERFORMANCE;
D O I
10.1109/TED.2013.2247765
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A 2-D semianalytical solution for the electrostatic potential valid for junctionless symmetric double-gate field-effect transistors in subthreshold regime is proposed, which is based on the parabolic approximation for the potential and removes previous limitations. Based on such a solution, a semianalytical expression for the current is derived. The potential and current models are validated through comparisons with TCAD simulations and are used to evaluate relevant short-channel effect parameters, such as threshold roll-off, drain-induced barrier lowering, and inverse subthreshold slope. The implications of different possible definitions of threshold voltage, either based on the potential in the channel or on a fixed current level, are discussed. Finally, a fully analytical simplification for the current is suggested, which can be used in compact models for circuit simulations.
引用
收藏
页码:1342 / 1348
页数:7
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