Microwave plasma torch abatement of NF3 and SF6

被引:28
作者
Hong, YC
Uhm, HS
Chun, BJ
Lee, SK
Hwang, SK
Kim, DS
机构
[1] Ajou Univ, Dept Mol Sci & Technol, Suwon 443749, South Korea
[2] LWSmartech Co Ltd, Suwon 443766, South Korea
[3] MAT Co Ltd, Ansung 456823, South Korea
关键词
D O I
10.1063/1.2182240
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
An atmospheric pressure microwave plasma torch as a tool for fluorinated compounds (FCs) abatement was presented. Detailed experiments were conducted on the abatement of NF3 and SF6 in terms of destruction and removal efficiency (DRE) using Fourier transform infrared (FTIR). Swirl gas, compressed air for stable plasma, was tangentially injected into the microwave plasma torch and a mixture of N-2, NF3, or SF6, and C2H4 was axially injected. The DRE of 99.1% for NF3 was achieved without an additive gas at the total flow rate of 50.1 liters per minute (lpm) by applying a microwave power of 1.4 kW. Also, a DRE of SF6 up to 90.1% was obtained at the total flow rate of 40.6 lpm using an applied microwave power of 1.4 kW. Experimental results indicate that the microwave plasma abatement device can successfully eliminate FCs in the semiconductor industry. (c) 2006 American Institute of Physics.
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页数:7
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