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- [2] The role of oxidation-induced cavities on the failure of the thermally grown oxide on binary β-NiAl alloys ZEITSCHRIFT FUR METALLKUNDE, 2003, 94 (03): : 157 - 162
- [7] Model for the formation of oxidation-induced stacking faults in Czochralski silicon Sadamitsu, Shinsuke, 1600, JJAP, Minato-ku, Japan (34):