Quantum-chemistry study of semiconductor systems: The initial oxidation of the (111)Si-H surface

被引:4
作者
Baierle, RJ [1 ]
Caldas, MJ
机构
[1] Univ Fed Santa Maria, Dept Fis, CCNE, BR-97105900 Santa Maria, RS, Brazil
[2] Univ Sao Paulo, Inst Fis, BR-05508900 Sao Paulo, Brazil
来源
INTERNATIONAL JOURNAL OF MODERN PHYSICS B | 1999年 / 13卷 / 21-22期
关键词
D O I
10.1142/S0217979299002629
中图分类号
O59 [应用物理学];
学科分类号
摘要
We propose a well-defined procedure to adapt a Quantum-Chemistry technique for the study of semiconductor structures. The procedure comprises use of a Bloch-periodic version of the standard molecular code and a nanocrystal cluster model. We reparametrize according to this procedure the MNDO/AM1 technique for Si and O and present this new parametrization AM1/Crystal. We apply AM1/Crystal to study oxidation of the hydrogenated silicon(111) surface, at the initial stages, when the absorbed oxygen atoms form isolated surface defects. We obtain self-consistent charge distributions and total energies for optimised geometries of different incorporation sites and configurations, including up to three oxygen atoms. We also obtain vibrational frequencies for the complexes that compare well with available experimental data. Our results confirm that backbond incorporation (Si-O-Si-H) is energetically favored compared to a surface hydroxyl configuration (Si-OH) and indicate that the first subsurface layer incorporation should proceed by island formation in a two-dimensional regime.
引用
收藏
页码:2733 / 2757
页数:25
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