Characterization of carbon fibers using X-ray phase nanotomography

被引：19
|
作者：
Diaz, A. [1 ]
Guizar-Sicairos, M. [1 ]
Poeppel, A. [2 ]
Menzel, A. [1 ]
Bunk, O. [1 ]
机构：
[1] Paul Scherrer Inst, CH-5232 Villigen, Switzerland
[2] Honda R&D Europe, D-63073 Offenbach, Germany
来源：
CARBON | 2014年 / 67卷
关键词：
HIGH-TENSILE STRENGTH; RETRIEVAL ALGORITHM; TOMOGRAPHY; COMPOSITES;
D O I：
10.1016/j.carbon.2013.09.066
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
X-ray ptychographic tomography has been recently developed for quantitative imaging of specimens on the nanometer scale. Here we present its application for the characterization of carbon fibers by mapping in three dimensions the mass density of entire fibers with diameters of several tens of micrometers with a resolution of about 100 nm. We characterized two fibers produced from two different precursors, revealing the spatial distribution of porosity and highly graphitized regions within the fibers. We further discuss the potential of ptychographic tomography as a new complementary technique for the characterization of carbon materials. (C) 2013 The Authors. Published by Elsevier Ltd. All rights reserved.
引用
收藏
页码：98 / 103
页数：6
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