Dependence of electrically induced strain on orientation and composition in Pb(ZrxTi1-x)O3 films

被引:1
|
作者
Sumi, K [1 ]
Qiu, H [1 ]
Shimada, M [1 ]
Sakai, S [1 ]
Yazaki, S [1 ]
Murai, M [1 ]
Moriya, S [1 ]
Miyata, Y [1 ]
Nishiwaki, T [1 ]
机构
[1] Seiko Epson Corp, IJA Dev Grp, Nagano 3990785, Japan
关键词
PZT; film; strain; permittivity; composition; orientation;
D O I
10.1143/JJAP.38.4843
中图分类号
O59 [应用物理学];
学科分类号
摘要
The effect of orientation and composition on electrically induced strain and relative permittivity of 600-nm-thick Pb(ZrxTi1-x)O-3 (PZT) films was investigated. High permittivity was obtained near the morphotropic phase boundary (MPB) composition, unaffected by orientation. For films with mixed textures of [111] and [100], the electrically induced strain was maximum near the MPB composition. While the electrically induced strain showed a tendency to increase with increasing Zr concentration x in the films with [111] preferred orientation, for the Pb(Zr0.65Ti0.35)O-3 film with [111] preferred orientation, an electrically induced strain of 0.54% was obtained under an electric field of 250 kV/cm.
引用
收藏
页码:4843 / 4846
页数:4
相关论文
共 50 条
  • [21] Composition control of Pb(ZrxTi1-x)O3 thin films prepared by metalorganic chemical vapor deposition
    Nagashima, K
    Funakubo, H
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2000, 39 (01): : 212 - 216
  • [22] Domain structure and residual-strain characterization of epitaxial Pb(ZrxTi1-x)O3 Thin films
    Saito, K
    Yamaji, I
    Akai, T
    Aratani, M
    Nagashima, K
    Funakubo, H
    PROCEEDINGS OF THE 2001 12TH IEEE INTERNATIONAL SYMPOSIUM ON APPLICATIONS OF FERROELECTRICS, VOLS I AND II, 2001, : 913 - 916
  • [23] Ferroelectric and optical properties of Pb(ZrxTi1-x)O3 bilayers
    Mathematics and Sciences College, Shanghai Normal University, Shanghai 200234, China
    不详
    Wuli Xuebao/Acta Physica Sinica, 2008, 57 (09): : 5968 - 5972
  • [24] Ferroelectric and optical properties of Pb(ZrxTi1-x)O3 bilayers
    Zhao Xiao-Ying
    Liu Shi-Jian
    Chu Jun-Hao
    Dai Ning
    Hu Gu-Jin
    ACTA PHYSICA SINICA, 2008, 57 (09) : 5968 - 5972
  • [25] Neutron diffraction studies of Pb(ZrxTi1-x)O3 ceramics
    Frantti, J
    Lappalainen, J
    Eriksson, S
    Ivanov, S
    Lantto, V
    Nishio, S
    Kakihana, M
    Rundlöf, H
    FERROELECTRICS, 2001, 261 (1-4) : 857 - 862
  • [26] Composition dependence of the photochemical reduction of Ag+ by as-grown Pb(ZrxTi1-x)O3 films on indium tin oxide electrode
    Zhang, Man
    Jiang, Chunxiang
    Dong, Wen
    Zheng, Fengang
    Fang, Liang
    Su, Xiaodong
    Shen, Mingrong
    APPLIED PHYSICS LETTERS, 2013, 103 (10)
  • [27] Neutron diffraction studies of Pb(ZrxTi1-x)O3 ceramics
    Frantti, Johannes
    Lappalainen, Jyrki
    Eriksson, Sten
    Lantto, Vilho
    Nishio, Shigeru
    Kakihana, Masato
    Ivanov, Sergey
    Rundlöf, Håkan
    1600, JJAP, Tokyo (39):
  • [28] Neutron diffraction studies of Pb(ZrxTi1-x)O3 ceramics
    Frantti, J
    Lappalainen, J
    Eriksson, S
    Lantto, V
    Nishio, S
    Kakihana, M
    Ivanov, S
    Rundlöf, H
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2000, 39 (9B): : 5697 - 5703
  • [29] Composition dependence of local piezoelectric nonlinearity in (0.3)Pb(Ni0.33Nb0.67)O3-(0.7)Pb(ZrxTi1-x)O3 films
    Griggio, F.
    Jesse, S.
    Qu, W.
    Kumar, A.
    Ovchinnikov, O.
    Tinberg, D. S.
    Kalinin, S. V.
    Trolier-McKinstry, S.
    JOURNAL OF APPLIED PHYSICS, 2011, 110 (04)
  • [30] Preparation of Zr-rich Pb(ZrxTi1-x)O3 thin films and their properties
    Wang, WS
    Chen, ZM
    Adachi, M
    Kawabata, A
    INTEGRATED FERROELECTRICS, 1998, 20 (1-4) : 191 - 203