Raman spectroscopy as analytical tool for the local structure of YBa2Cu3Ox thin films

被引：29

作者：

Iliev, MN ^{[1
]}

Zhang, PX ^{[1
]}

Habermeier, HU ^{[1
]}

Cardona, M ^{[1
]}

机构：

[1] UNIV SOFIA, FAC PHYS, BU-1126 SOFIA, BULGARIA

来源：

JOURNAL OF ALLOYS AND COMPOUNDS | 1997年 / 251卷 / 1-2期

关键词：

Raman scattering; thin films; phase separation; laser annealing;

D O I：

10.1016/S0925-8388(96)02777-6

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Raman spectroscopy is an ideal analytical tool for precise determination of crystallographic directions of epitaxial YBa2Cu3Ox (YBCO) thin films. It can also be used for the the study of oxygen ordering and its dependence on growing conditions and subsequent treatments. Examples of Raman spectra of YBCO epitaxial thin films presented in this work provide evidence that microdomains of different oxygen arrangement (Ortho-I, Ortho-II, T, T') may coexist within the same sample. Such a phase separation occurs at a microscopic scale and is most clearly pronounced for underdoped samples. The transformation of local oxygen arrangements with changes of oxygen content upon thermal treatment in vacuum and in air is also studied and discussed.

引用

页码：99 / 102

页数：4

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