Electromagnetic field computation in semiconductor laser resonators

被引:7
作者
Vallius, T [1 ]
Tervo, J [1 ]
Vahimaa, P [1 ]
Turunen, J [1 ]
机构
[1] Univ Joensuu, Dept Phys, FI-80101 Joensuu, Finland
关键词
D O I
10.1364/JOSAA.23.000906
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
An electromagnetic method based on rigorous diffraction theory of gratings is applied to the analysis of fields in semiconductor laser cavities. The method is based on the Fourier modal method; it is fully rigorous for infinitely periodic resonators and highly accurate for single resonators when absorbing boundary conditions are applied. Fundamental-mode intracavity and near-field distributions are evaluated for some selected geometries, and resonance frequencies are predicted. (c) 2006 Optical Society of America.
引用
收藏
页码:906 / 911
页数:6
相关论文
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Vallius, T ;
Tervo, J ;
Vahimaa, P ;
Turunen, J .
OPTICS EXPRESS, 2005, 13 (16) :5994-5999
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