Cu2ZnSnS4 thin films grown by spray pyrolysis: characterization by Raman spectroscopy and X-ray diffraction

被引：30

作者：

Gurieva, G. ^{[1
]}

Guc, M.

Bruk, L. I.

Izquierdo-Roca, V.

Perez Rodriguez, A.

Schorr, S. ^{[1
]}

Arushanov, E.

机构：

[1] Helmholtz Zentrum Berlin Mat & Energie, Dept Crystallog, D-14109 Berlin, Germany

来源：

PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 10, NO 7-8 | 2013年 / 10卷 / 7-8期

关键词：

Cu2ZnSnS4; GIXRD; Rietveld analysis;

D O I：

10.1002/pssc.201200856

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Cu2ZnSnS4 (CZTS) thin films were deposited on glass substrates by spray pyrolysis a fast, cost effective and vacuum-free method. X-ray fluorescence, Raman spectroscopy and grazing incidence X-ray diffraction, were used to characterize the obtained thin films. The analysis of these data showed a close to stoichiometry composition of the films and CZTS adopts the kesterite type structure but with poor crystalline quality and possible existence of secondary phases, such as ZnS and Cu2SnS3. An annealing procedure in presence of elemental Sn and S was applied in order to improve the quality of the films. The annealing leads to an improvement of the crystalline quality of the thin films. The lattice parameters a and c of the annealed CZTS thin films were obtained as result of the Rietveld analysis of the gracing incidence X-ray diffraction data. (C) 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim

引用

页码：1082 / 1085

页数：4

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