Thin film;
Optical Constants;
Single oscillator model;
Bi2S3;
ELECTRICAL-PROPERTIES;
PYROLYSIS;
D O I:
暂无
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
Bismuth Sulfide (Bi2S3) thin film was prepared by spray pyrolysis on glass substrate at 270 degrees C, by using bismuth chloride (BiCl3) and Thiourea (CS (NH2)(2)). The optical constants and thickness were extracted using the pattern search optimization technique. The optical constants confirm that the Bi2S3 film has a direct gap of 1.56 eV. The dispersion of refractive index in Bi2S3 was analyzed using the concept of the single oscillator model. The dielectric constants represented by the lattice dielectric, the dispersion parameters E-0 and E-d, and the rth moments, M-1 and M-3 were determined. It is interesting to note that Bi2S3 appears to fall into the covalent class. The values ratio of the carrier concentration to effective masse and plasma frequency were also evaluated.
机构:
Univ Loughborough, Dept Chem, Loughborough LE11 3TU, Leics, EnglandUniv Malaya, Dept Chem, Fac Sci, Kuala Lumpur 50603, Malaysia
Tahir, Asif Ali
Ehsan, Muhammad Ali
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机构:
Quaid I Azam Univ, Dept Chem, Islamabad 45320, PakistanUniv Malaya, Dept Chem, Fac Sci, Kuala Lumpur 50603, Malaysia
Ehsan, Muhammad Ali
Mazhar, Muhammad
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机构:
Univ Malaya, Dept Chem, Fac Sci, Kuala Lumpur 50603, MalaysiaUniv Malaya, Dept Chem, Fac Sci, Kuala Lumpur 50603, Malaysia
Mazhar, Muhammad
Wijayantha, K. G. Upul
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机构:
Univ Malaya, Dept Chem, Fac Sci, Kuala Lumpur 50603, Malaysia
Univ Loughborough, Dept Chem, Loughborough LE11 3TU, Leics, EnglandUniv Malaya, Dept Chem, Fac Sci, Kuala Lumpur 50603, Malaysia
Wijayantha, K. G. Upul
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机构:
Zeller, Matthias
Hunter, A. D.
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机构:
Youngstown State Univ, STaRBURSTT Cyberdiffract Consortium, Youngstown, OH 44555 USA
Youngstown State Univ, Dept Chem, Youngstown, OH 44555 USAUniv Malaya, Dept Chem, Fac Sci, Kuala Lumpur 50603, Malaysia