Measurement and Metrology in Advanced Manufacturing Processes PREFACE

被引：1

作者：

Kankar, Pavan Kumar ^{[1
]}

Moona, Girija ^{[2
,3
]}

Desai, Kaushal A. ^{[4
]}

机构：

[1] Indian Inst Technol Indore, Dept Mech Engn, Syst Dynam Lab, Indore 453552, India

[2] CSIR, Length Dimens & Nano Metrol, Natl Phys Lab, New Delhi 110012, India

[3] CSIR, Acad Sci & Innovat Res AcSIR, HRDC Campus, Ghaziabad 201002, India

[4] Indian Inst Technol Jodhpur, Dept Mech Engn, Jodhpur 342030, India

来源：

MAPAN-JOURNAL OF METROLOGY SOCIETY OF INDIA | 2022年 / 37卷 / 04期

关键词：

Advanced manufacturing process; Additive manufacturing; Metrology; Sensor; Measurement;

D O I：

10.1007/s12647-022-00606-w

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

New and improved measurement methods are paramount to ensure in-process monitoring of advanced manufacturing processes and quality products. This editorial discusses the outline of the special issue consisting of 15 peer-reviewed manuscripts in the domain of "Measurement and Metrology in Advanced Manufacturing Processes." These research and review articles discuss the relevance, state-of-the-art methods, and ongoing research on the advancement of manufacturing processes with measurements and metrology perspectives by different research groups globally. The significance of measurement and metrology is recognized in various applications such as additive manufacturing, photopolymer jetting, submerged arc welding, micro-electrical discharge machining, and reverse manufacturing.

引用

页码：703 / 705

页数：3