Accurate Characterization of Film on Substrate Transmitting Specimens by the Envelope Method

被引：0
作者：
Minkov, Dorian Asenov [1 ]
Gavrilov, Gavril Mihaylov [1 ]
Marquez, Emilio [2 ]
Ruano, Susana Maria Fernandez [3 ]
机构：
[1] Tech Univ Sofia, Coll Energy & Elect, Bul Bulgaria 31, Botevgrad 2140, Bulgaria
[2] Univ Cadiz, Fac Sci, Duque Najera 8, Cadiz 11071, Spain
[3] CIEMAT, Photovolta Solar Energy Unit, Ave Complutense 40, Madrid 28040, Spain
来源：
2016 XXV INTERNATIONAL SCIENTIFIC CONFERENCE ELECTRONICS (ET) | 2016年
关键词：
accurate optical characterization; thin film; envelope method; negative feedback; OPTICAL-CONSTANTS; BEHAVIOR;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Higher accuracy is accomplished in characterization of thin film on substrate light transmitting specimens by the envelope method. This is a result of more accurate determination of the film thickness variation, based on minimization of film thickness error metrics. Three chalcogenide thin film specimens are characterized, and is shown that their thickness error metrics are better than those for previous characterizations of the same specimens.
引用
收藏
页数：4
相关论文
共 50 条
  • [31] An easy way to obtain thin gold film on silica glass substrate by chemical method
    Lamic-Humblot, Anne-Felicie
    Casale, Sandra
    Leger, Cedric
    Alperine, Serge
    Louis, Catherine
    THIN SOLID FILMS, 2013, 539 : 151 - 153
  • [32] Method for accurate measurement of wideband transmittance of thin-film coatings at large angle of incidence
    Liu, Yongli
    Zhang, Jinlong
    Cheng, Xinbin
    Wang, Zhanshan
    APPLIED OPTICS, 2013, 52 (02) : 226 - 230
  • [33] Polycrystalline PZT film on Porous Ti substrate synthesized by Ultrasonic Assisted Hydrothermal Method
    Ohta, Kanako
    Isobe, Gaku
    Bornmann, Peter
    Hemsel, Tobias
    Morita, Takeshi
    2012 IEEE INTERNATIONAL ULTRASONICS SYMPOSIUM (IUS), 2012, : 186 - 189
  • [34] Characterization of the interfacial strength of SiNx/GaAs film/substrate systems using energy balance in nanoindentation
    Hongtao Xie
    Han Huang
    Journal of Materials Research, 2013, 28 : 3137 - 3145
  • [35] Debonding characterization of stiff film/compliant substrate systems based on the bilinear cohesive zone model
    Long, Hao
    Liu, Yanwei
    Wei, Yueguang
    ENGINEERING FRACTURE MECHANICS, 2022, 265
  • [36] Fabrication and characterization of YBCO thin film on CeO2/a-plane sapphire substrate
    Shirakawa, M
    Miura, M
    Ohazama, T
    Shingai, Y
    Saito, A
    Mukaida, M
    Ohshima, S
    PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS, 2004, 412 : 1277 - 1280
  • [37] Characterization of the interfacial strength of SiNx/GaAs film/substrate systems using energy balance in nanoindentation
    Xie, Hongtao
    Huang, Han
    JOURNAL OF MATERIALS RESEARCH, 2013, 28 (22) : 3137 - 3145
  • [38] Swanepoel method for estimating the film thickness and complex index of refraction by using only the lower envelope: Special case
    Aly, Kamal A.
    MATERIALS CHEMISTRY AND PHYSICS, 2023, 310
  • [39] Optical characterization of Cu3N thin film with Swanepoel method
    Dorranian, Davoud
    Dejam, Laya
    Mosayebian, Gelareh
    JOURNAL OF THEORETICAL AND APPLIED PHYSICS, 2012, 6 (01)
  • [40] A new method for the dynamic deformation characterization of thin-film stacked structures
    Zhao, Facheng
    Yeo, Alfred
    Che, Faxing
    Yang, Kai
    Tian, Yujia
    Zhou, Kun
    MRS COMMUNICATIONS, 2021, 11 (06) : 917 - 923
12345