Analysis of Dispersion Characteristic of Microstrip Lines on Ferrite & Silicon Structures with Spectral-Domain Method

被引：1

作者：

Yang Hong ^{[1
]}

Chen Zhe-yu ^{[1
]}

Lv Kun-yi ^{[1
]}

机构：

[1] Chongqing Univ Posts & Telecommun, Coll Photoelect, Chongqing 400065, Peoples R China

来源：

MECHANICAL AND ELECTRONICS ENGINEERING III, PTS 1-5 | 2012年 / 130-134卷

关键词：

Microstrip; Ferrite; SDA; Dispersion;

D O I：

10.4028/www.scientific.net/AMM.130-134.1244

中图分类号：

TH [机械、仪表工业];

学科分类号：

0802 ;

摘要：

In this paper, we presented two types of ferrite&si double layer substrate microstrip lines structures and derived waveguide admittance through coordinate rotation and Fourier transformation of Maxwell equations, then we analyzed its characteristics. We performed dispersion characteristic calculations on microstrip lines, discussed influence of various parameters of microstrip lines on dispersion characteristics and compared their characteristics, then we discovered parameters influence on one specific type of structure dispersion is minimum, especially on technique dimension of dielectric. It can make applications for IC fabrication.

引用

页码：1244 / 1249

页数：6

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