Quantitative transmission electron microscopy at atomic resolution

被引：2

作者：

Allen, L. J. ^{[1
]}

D'Alfonso, A. J. ^{[1
]}

Forbes, B. D. ^{[1
]}

Findlay, S. D. ^{[2
]}

LeBeau, J. M. ^{[3
]}

Stemmer, S. ^{[4
]}

机构：

[1] Univ Melbourne, Sch Phys, Melbourne, Vic 3010, Australia

[2] Monash Univ, Sch Phys, Clayton, Vic 3800, Australia

[3] North Carolina State Univ, Dept Mat Sci & Engn, Raleigh, NC 27695 USA

[4] Univ Calif Santa Barbara, Dept Mat, Santa Barbara, CA 93106 USA

来源：

ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2011 (EMAG 2011) | 2012年 / 371卷

基金：

澳大利亚研究理事会; 美国国家科学基金会;

关键词：

CONTRAST;

D O I：

10.1088/1742-6596/371/1/012009

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

In scanning transmission electron microscopy (STEM) it is possible to operate the microscope in bright-field mode under conditions which, by the quantum mechanical principle of reciprocity, are equivalent to those in conventional transmission electron microscopy (CTEM). The results of such an experiment will be presented which are in excellent quantitative agreement with theory for specimens up to 25 nm thick. This is at variance with the large contrast mismatch (typically between two and five) noted in equivalent CTEM experiments. The implications of this will be discussed.

引用

页数：4

共 12 条

[1] Lattice-resolution contrast from a focused coherent electron probe. Part I [J].

Allen, LJ ;

Findlay, SD ;

Oxley, MP ;

Rossouw, CJ .

ULTRAMICROSCOPY, 2003, 96 (01) :47-63

[2] IMAGE CONTRAST IN A TRANSMISSION SCANNING ELECTRON MICROSCOPE [J].

COWLEY, JM .

APPLIED PHYSICS LETTERS, 1969, 15 (02) :58-&

[3] Quantum mechanical model for phonon excitation in electron diffraction and imaging using a Born-Oppenheimer approximation [J].

Forbes, B. D. ;

Martin, A. V. ;

Findlay, S. D. ;

D'Alfonso, A. J. ;

Allen, L. J. .

PHYSICAL REVIEW B, 2010, 82 (10)

[4] Hunting the Stobbs factor [J].

Howie, A .

ULTRAMICROSCOPY, 2004, 98 (2-4) :73-79

[5]

Kirkland E., 1998, Advanced computing in Electron Microscopy

[6] Quantitative atomic resolution scanning transmission electron microscopy [J].

LeBeau, James M. ;

Findlay, Scott D. ;

Allen, Leslie J. ;

Stemmer, Susanne .

PHYSICAL REVIEW LETTERS, 2008, 100 (20)

[7] Experimental quantification of annular dark-field images in scanning transmission electron microscopy [J].

LeBeau, James M. ;

Stemmer, Susanne .

ULTRAMICROSCOPY, 2008, 108 (12) :1653-1658

[8] Quantitative comparisons of contrast in experimental and simulated bright-field scanning transmission electron microscopy images [J].

LeBeau, James M. ;

D'Alfonso, Adrian J. ;

Findlay, Scott D. ;

Stemmer, Susanne ;

Allen, Leslie J. .

PHYSICAL REVIEW B, 2009, 80 (17)

[9] High-angle scattering of fast electrons from crystals containing heavy elements: Simulation and experiment [J].

LeBeau, James M. ;

Findlay, Scott D. ;

Wang, Xiqu ;

Jacobson, Allan J. ;

Allen, Leslie J. ;

Stemmer, Susanne .

PHYSICAL REVIEW B, 2009, 79 (21)

[10]

Spence J. C. H., 2003, Highresolution electron microscopy

← 1 2 →