Poly(Vinylidenefluoride-Trifluoroethylene) P(VDF-TrFE)/Semiconductor Structure Ferroelectric-Gate FETs

被引:5
作者
Fujisaki, Yoshihisa [1 ]
机构
[1] YourFriend, Hachioji, Tokyo 1920916, Japan
来源
FERROELECTRIC-GATE FIELD EFFECT TRANSISTOR MEMORIES: DEVICE PHYSICS AND APPLICATIONS | 2016年 / 131卷
关键词
INSULATOR-SEMICONDUCTOR STRUCTURES; FIELD-EFFECT TRANSISTORS; POLYVINYLIDENE FLUORIDE; SPACE ENVIRONMENTS; POLYMERS; FILMS; SUMS;
D O I
10.1007/978-94-024-0841-6_8
中图分类号
O59 [应用物理学];
学科分类号
摘要
Ferroelectric field effect transistors (FeFETs) composed of P(VDF-TrFE) (Poly(Vinylidenefluoride-Tirfluoroethylene)) thin films and semiconductor substrates show excellent ferroelectric transistor characteristics. Since P(VDF-TrFE) has the ferroelectric polarization as large as those of oxide ferroelectric materials with much lower dielectric constant, it is an ideal material to build FeFETs with the combination to inorganic semiconductor materials. In addition, the process condition to form P(VDF-TrFE) is much milder to underlying semiconducting material compared to oxide ferroelectrics. Therefore, the improvement on the retention characteristics is expected by employing P(VDF-TrFE) ferroelectrics in FeFET instead of oxide ferroelectrics. The potential of P(VDF-TrFE) FeFET is discussed in this chapter.
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页码:157 / 183
页数:27
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