Growth and Characterization of CuO Thin Films Prepared by Spray Pyrolysis with Various Precursors

被引：0
作者：
Moumen, Abderrahim [1 ]
Hartiti, Bouchaib [1 ]
Fadili, Salah [1 ]
Siadat, Maryam [2 ]
Thevenin, Philippe [3 ]
机构：
[1] Hassan II Casablanca Univ, ANEPMAER Grp FSTM, MAC&PM Lab, BP 146, Mohammadia, Morocco
[2] Univ Lorraine, LCOMS Lab, Metz, France
[3] Univ Lorraine Metz, Dept Phys, LMOPS Lab, Metz, France
来源：
PROCEEDINGS OF 2016 INTERNATIONAL RENEWABLE & SUSTAINABLE ENERGY CONFERENCE (IRSEC' 16) | 2016年
关键词：
CuO; Thin films; XRD; Gap; Refractive index; Dielectric constant; SENSOR;
D O I：
暂无
中图分类号：
X [环境科学、安全科学];
学科分类号：
08 ; 0830 ;
摘要：
in In this work, we study the effect or the different copper precursors on the structural optical and electrical properties of CuO thin films deposited on glass substrates using spray pyrolysis technique, the phase of tenorite (CuO) are identified using X-Ray diffraction. A single phase without impurities is observed for the three precursors. The band gap energy and others optical parameters are calculated using absorbance/transmittance data giving by spectrophotometry. The semiconductor aspect of our films are showed by four probes method.
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页码：26 / +
页数：5
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