Demystifying Automotive Safety and Security for Semiconductor Developer

被引:0
作者
Prasanth, V. [1 ]
Foley, David [1 ]
Ravi, Srivaths [1 ]
机构
[1] Texas Instruments Inc, Dallas, TX 75266 USA
来源
2017 IEEE INTERNATIONAL TEST CONFERENCE (ITC) | 2017年
关键词
Functional Safety; ISO26262; IEC61508; cyber security; EVITA; SAE J3101;
D O I
暂无
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
Advances in both semiconductor and automotive industry are today enabling the next generation of vehicles with significant electronics content than ever before. Consumers can now avail vehicle offerings in the form of Electric and Hybrid Electric Vehicles (EV/HEV) that have improved fuel efficiency, provide enhanced driver-passenger comfort and experience through Advance Driver Assistance Systems (ADAS) and car infotainment systems, and more. Increasing electronics, software content, and connectivity drive two consumer concerns - "functional safety" and "security" - to the forefront. In this tutorial, we dissect these concerns from an end application perspective and translate the system level requirements and standards into semiconductor development requirements. We indicate both current and emerging practices, and touch upon areas requiring new or optimal design and electronic design automation (EDA) solutions. While functional safety is the primary focus for deep-dive in this tutorial, we also examine key facets of automotive security which is now emerging as a critical area for further understanding and standardization.
引用
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页数:10
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