Trigger and Self-Latch Mechanisms of n-p-n Bistable Resistor

被引:22
作者
Han, Jin-Woo [1 ]
Meyyappan, Meyya [1 ]
机构
[1] NASA, Ames Res Ctr, Ctr Nanotechnol, Moffett Field, CA 94035 USA
关键词
Self latch; n-p-n device; floating base; bistable resistor; biristor;
D O I
10.1109/LED.2013.2297277
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Trigger and self-latch mechanisms in n-p-n bistable resistor (biristor) were investigated. A two terminal vertical n-p-n biristor with floating p-type base was fabricated on a bulk silicon wafer. The temperature and current compliance effects on the current-voltage characteristics were analyzed to understand the underlying physical mechanism. The fact that the current compliance is temperature independent suggests that latch-up is triggered by band-to-band tunneling. In contrast, the high temperature and current compliance diminished the latch-down and hysteresis loop, which reveals that impact ionization is responsible for self-latching at bistable regime.
引用
收藏
页码:387 / 389
页数:3
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