All-optical axial super resolving imaging using a low-frequency binary-phase mask

被引:53
作者
Zalevsky, Z [1 ]
Shemer, A
Zlotnik, A
Eliezer, EB
Marom, E
机构
[1] Bar Ilan Univ, Sch Engn, IL-52900 Ramat Gan, Israel
[2] Tel Aviv Univ, Sch Elect Engn, IL-69778 Ramat Aviv, Israel
关键词
D O I
10.1364/OE.14.002631
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
In this paper we present a new approach for obtaining all-optical axial super-resolving imaging by using a non-diffractive binary phase mask inserted at the entrance pupil of an imaging lens. The designed element is tested numerically and experimentally on various practical testing benches and eventually is inserted into the lens of a cellular phone camera. (c) 2006 Optical Society of America.
引用
收藏
页码:2631 / 2643
页数:13
相关论文
共 18 条
[1]  
ATEBARA N, 1990, Patent No. 4955904
[2]   Experimental realization of an imaging system with an extended depth of field [J].
Ben-Eliezer, E ;
Marom, E ;
Konforti, N ;
Zalevsky, Z .
APPLIED OPTICS, 2005, 44 (14) :2792-2798
[3]   All-optical extended depth of field imaging system [J].
Ben-Eliezer, E ;
Zalevsky, Z ;
Marom, E ;
Konforti, N .
JOURNAL OF OPTICS A-PURE AND APPLIED OPTICS, 2003, 5 (05) :S164-S169
[4]  
BENELIEZER E, 2003, Patent No. 03076984
[5]  
CASTANEDA JO, 1990, APPL OPTICS, V29, P994
[6]  
CASTANEDA JO, 1989, APPL OPTICS, V28, P2666
[7]  
CATHY WT, 1999, Patent No. 9957599
[8]  
CATHY WT, 2003, Patent No. 03052492
[9]   Electronic imaging using a logarithmic asphere [J].
Chi, WL ;
George, N .
OPTICS LETTERS, 2001, 26 (12) :875-877
[10]   EXTENDED DEPTH OF FIELD THROUGH WAVE-FRONT CODING [J].
DOWSKI, ER ;
CATHEY, WT .
APPLIED OPTICS, 1995, 34 (11) :1859-1866