ISO 26262 Compliant Memory BIST Architecture

被引：0

作者：

Sargsyan, David ^{[1
]}

机构：

[1] Yerevan State Univ, Yerevan, Armenia

来源：

2017 ELEVENTH INTERNATIONAL CONFERENCE ON COMPUTER SCIENCE AND INFORMATION TECHNOLOGIES (CSIT) | 2017年

关键词：

automotive; safety; ASIL; built-in self-test; in-field test;

D O I：

暂无

中图分类号：

TP18 [人工智能理论];

学科分类号：

081104 ; 0812 ; 0835 ; 1405 ;

摘要：

The modern automotive industry has entered an era where tendencies are towards the increased automation and connectivity. The proportion of electronics-controlled systems is steadily growing in vehicles. In parallel the safety and reliability requirements to automobiles are becoming more stringent due to the increased number of accidents with fatalities on the roads. The problem is complicated by the fact that automotive has started to use cutting-edge technologies irrespective of their maturity level. This paper describes the use of BIST implementations for self-test of memories in an automotive SoC, to support testing in mission mode. Case study at the end of the paper demonstrates a practical built-in self-test architecture implementation providing efficient solutions for both production and in-field testing.

引用

页码：78 / 82

页数：5

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