A Schmitt-trigger based low read power 12T SRAM cell

被引:17
作者
Sachdeva, Ashish [1 ]
Tomar, V. K. [1 ]
机构
[1] GLA Univ, Dept Elect & Commun Engn, Mathura, India
关键词
Read stability; Low power; Process variation; Static random-access memory (SRAM); Write ability; Half select; SUBTHRESHOLD SRAM; LOW-VOLTAGE; CMOS; 8T; DESIGN; STABILITIES; TECHNOLOGY; ACCESS; IMPACT; ROBUST;
D O I
10.1007/s10470-020-01718-6
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
In this article, a Schmitt trigger based 12-Transistors(ST12T) static random-access memory (SRAM) bit-cell has been proposed. The Read Power of proposed cell is reduced by 29.17%/ 24.14% /7.66% /5.87% /7.67% /16.62% when compared to 6T/ 7T/ TA8T/ 9T/ PPN10T/ D2p11T SRAM cells. Proposed ST12T cell also shows 1.52x and 1.86x lesser variability in read current and read power respectively as compared to conventional 6T SRAM cell. Further, the write access time/read access time of the proposed topology are improved by 1.71 x /1. 82x as compared to 6T SRAM cell. The read power delay product of proposed ST12T cell is minimum with variation in supply voltage from 0.5 to 1 V when compared with all considered SRAM cells. ST12T SRAM cell also exhibits 26.82% and 8.87% higher read static noise margin and write static noise margin respectively as compared to conventional 6T SRAM cell. This may be attributed to Schmitt trigger design of inverters in core latch of proposed SRAM cell. The proposed bit-cell is free from half select issue and supports bit interleaving format. Authors have used cadence virtuoso tool with Generic Process Design Kit 45 nm technology file to carry out simulation.
引用
收藏
页码:275 / 295
页数:21
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