Field emission of copper nanowires grown in polymer ion-track membranes

被引：37
作者：
Maurer, F
Dangwal, A
Lysenkov, D
Müller, G
Toimil-Molares, ME
Trautmann, C
Brötz, J
Fuess, H
机构：
[1] Tech Univ Darmstadt, Dept Mat & Earth Sci, D-64287 Darmstadt, Germany
[2] Univ Gesamthsch Wuppertal, FB C Phys, D-42097 Wuppertal, Germany
[3] GSI, D-64291 Darmstadt, Germany
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2006年 / 245卷 / 01期
关键词：
field emission; copper; nanowires; heavy-ion irradiation; ion-track etch technique; polymeric membrane; field emission scanning microscopy;
D O I：
10.1016/j.nimb.2005.11.124
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
Field emission properties of randomly distributed copper nanowires are presented. The wires were potentiostatically deposited into the pores of polycarbonate membranes produced by the ion-track etch technique. The diameter and length of the vertically aligned wires with number densities between 10(6) and 10(8) wires/cm(2) were in the range of 210-330 nm and 8-18 mu m, respectively. By means of field emission scanning microscopy, emission site densities between 0.4 x 10(5) cm(-2) and 1.4 x 10(5) cm(-2) were obtained for nA currents at 6 V/mu m. Two-thirds of the nanowire emitters showed Fowler-Nordheim behaviour with an average field enhancement factor of beta = 245, which is about three times higher than expected for a cylindrical wire geometry with a half-sphere tip. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码：337 / 341
页数：5
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