Simulation process for the design and optimization of a machine vision system for specular surface inspection

被引:3
作者
Seulin, R
Bonnot, N
Merienne, F
Gorria, P
机构
来源
MACHINE VISION AND THREE-DIMENSIONAL IMAGING SYSTEMS FOR INSPECTION AND METROLOGY II | 2002年 / 4567卷
关键词
machine vision; specular surface; industrial inspection; lighting modeling; simulation;
D O I
10.1117/12.455250
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
This work aims at detecting surface defects on reflecting industrial parts. A machine vision system, performing the detection of geometric aspect surface defects, is completely described. The revealing of defects is realized by a particular lighting device. It has been carefully designed to ensure the imaging of defects. The defects segmentation is then straightforward and fast to compute. The imaging conditions have been particularly studied because they influence strongly the quality of acquired images and consequently the quality of image processing results. These imaging conditions are often the fact of experiments: numerous attempts on lighting features and on the relative positions between the cameras, the lighting and the object are still necessary. To bring a help in the conception of these imaging conditions, a complete simulation is proposed. The imaging and lighting system has been completely modeled. The simulation, based on computer graphics, enables here the rendering of realistic images. Simulation provides a very efficient way of conception which is applied to the design of a machine vision prototype.
引用
收藏
页码:129 / 140
页数:12
相关论文
共 10 条
[1]  
APDACA A, 1999, ADV RENDERMAN CREATI
[2]   Dark Field, Scheimpflug imaging for surface inspection [J].
Bakolias, C ;
Forrest, AK .
MACHINE VISION APPLICATIONS IN INDUSTRIAL INSPECTION V, 1997, 3029 :57-68
[3]  
BATCHELOR BG, 1985, AUTOMATED VISUAL INS, pCH7
[4]  
Blinn J.F., 1978, Computer Graphics (SIGGRAPH 78 Proceedings), V12, P286
[5]   Study of the imaging conditions and processing for the aspect control of specular surfaces [J].
Delcroix, G ;
Seulin, R ;
Lamalle, B ;
Gorria, P ;
Merienne, F .
JOURNAL OF ELECTRONIC IMAGING, 2001, 10 (01) :196-202
[6]  
KIERRKEGAARD P, 1996, OPTICAL ENG, V35
[7]   SURFACE REFLECTION - PHYSICAL AND GEOMETRICAL PERSPECTIVES [J].
NAYAR, SK ;
IKEUCHI, K ;
KANADE, T .
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 1991, 13 (07) :611-634
[8]   STRUCTURED HIGHLIGHT INSPECTION OF SPECULAR SURFACES [J].
SANDERSON, AC ;
WEISS, LE ;
NAYAR, SK .
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 1988, 10 (01) :44-55
[9]  
SEULIN R, 2001, SPIE C MACH VIS APPL, V4301
[10]   Least distorted pump mapping onto surface patches [J].
Zhang, JJ .
COMPUTERS & GRAPHICS, 1998, 22 (2-3) :233-242