A silicon-black phosphorous based surface plasmon resonance sensor for the detection of NO2 gas

被引：40
|
作者：
Maurya, J. B. [1 ]
Prajapati, Y. K. [1 ]
Raikwar, S. [2 ]
Saini, J. P. [3 ]
机构：
[1] Motilal Nehru Natl Inst Technol Allahabad, Dept Elect & Commun Engn, Allahabad 211004, Uttar Pradesh, India
[2] Buldelkhand Inst Engn & Technol, Dept Elect Engn, Jhansi 284128, Uttar Pradesh, India
[3] Netaji Subhas Inst Technol NSIT, Dept Elect & Commun Engn, New Delhi 110078, India
来源：
OPTIK | 2018年 / 160卷
关键词：
Surface plasmon resonance; Black phosphorous; Silicon; REFRACTIVE-INDEX MEASUREMENT; SENSITIVITY ENHANCEMENT; THIN; REFRACTOMETER; PERFORMANCE; POLARITONS; INTERFEROMETER; MODES; FIBER; FILMS;
D O I：
10.1016/j.ijleo.2018.02.002
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
In the presented article a silicon-black phosphorous based surface plasmon resonance sensor is proposed for the detection of NO2 gas. This sensor takes the advantage of specific attachment property of NO2 gas at the surface of black phosphorous nanolayer. The high purely real refractive index of silicon is utilized for the enhancement of sensitivity by a large factor. The performance defining parameters like shift in resonance angle, minimum reflectance, beam width of reflectance curve, and penetration depth are calculated and compared also. (C) 2018 Elsevier GmbH. All rights reserved.
引用
收藏
页码：428 / 433
页数：6
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