Genetic method to optimize binary dithering technique for high-quality fringe generation

被引:92
作者
Lohry, William [1 ]
Zhang, Song [1 ]
机构
[1] Iowa State Univ, Dept Mech Engn, Ames, IA 50011 USA
基金
美国国家科学基金会;
关键词
SHAPE MEASUREMENT; MODULATION;
D O I
10.1364/OL.38.000540
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The recently proposed dithering techniques could substantially improve measurement quality when fringes are wide, but offer limited improvement when fringes are narrow. This Letter presents a genetic algorithm to optimize the dithering technique for sinusoidal structured pattern representation. We believe both simulation and experimental results show that this proposed algorithm can substantially improve fringe quality for both narrow and wide fringe patterns. (c) 2013 Optical Society of America
引用
收藏
页码:540 / 542
页数:3
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