Editorial: 50 years of X-ray mapping

被引:1
作者
Lyman, CE
机构
关键词
D O I
10.1017/S1431927606060223
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:1 / 1
页数:1
相关论文
共 50 条
  • [41] Energy-dispersive X-ray diffraction mapping on a benchtop X-ray fluorescence system
    Lane, David W.
    Nyombi, Antony
    Shackel, James
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2014, 47 : 488 - 494
  • [42] Quantitative X-ray mapping with high resolution
    Watanabe, M
    Carpenter, DT
    Barmak, K
    Williams, DB
    ELECTRON MICROSCOPY AND ANALYSIS 1997, 1997, (153): : 295 - 298
  • [43] X-ray atomic mapping of quantum dots
    Dey, Arka B.
    Sanyal, Milan K.
    Keane, Denis T.
    Campbell, Gavin P.
    Liu, Bo-Hong
    Farrer, Ian
    Ritchie, David A.
    Bedzyk, Michael J.
    PHYSICAL REVIEW MATERIALS, 2020, 4 (05)
  • [44] X-ray mapping and interpretation of scatter diagrams
    Moran, Ken
    Wuhrer, Richard
    MICROCHIMICA ACTA, 2006, 155 (1-2) : 209 - 217
  • [45] X-RAY MAPPING OF FLAWS BY COMPUTER GRAPHICS
    HARTM, F
    MATERIALS EVALUATION, 1968, 26 (09) : A33 - &
  • [46] X-RAY ECLIPSE MAPPING OF AR LACERTAE
    WHITE, NE
    SHAFER, RA
    HORNE, K
    PARMAR, AN
    CULHANE, JL
    ASTROPHYSICAL JOURNAL, 1990, 350 (02) : 776 - 795
  • [47] MAPPING ELECTRON DENSITIES BY X-RAY DIFFRACTION
    HIRSHFEL.S
    ISRAEL JOURNAL OF CHEMISTRY, 1964, 2 (5A) : 221 - &
  • [48] Experimentally validated x-ray image simulations of 50 μm x-ray PIV tracer particles
    Parker, Jason T.
    Makiharju, Simo A.
    MEASUREMENT SCIENCE AND TECHNOLOGY, 2022, 33 (05)
  • [49] 25 years of magnetic x-ray dichroism
    van der Laan, Gerrit
    MAGNETISM AND SYNCHROTRON RADIATION: TOWARDS THE FOURTH GENERATION LIGHT SOURCES, 2013, 151 : 257 - 287
  • [50] The next ten years of X-ray science
    Makina Yabashi
    Hitoshi Tanaka
    Nature Photonics, 2017, 11 : 12 - 14