Subsurface defects of fused silica optics and laser induced damage at 351 nm

被引:103
作者
Liu Hongjie [1 ]
Huang Jin [1 ]
Wang Fengrui [1 ]
Zhou Xinda [1 ]
Ye Xin [1 ]
Zhou Xiaoyan [1 ]
Sun Laixi [1 ]
Jiang Xiaodong [1 ]
Sui Zhan [1 ]
Zheng Wanguo [1 ]
机构
[1] China Acad Engn Phys, Res Ctr Laser Fus, Mianyang 621900, Peoples R China
基金
中国国家自然科学基金;
关键词
POLISHING-INDUCED CONTAMINATION; NATIONAL IGNITION FACILITY; SURFACE-ROUGHNESS; TECHNOLOGY; DENSITY;
D O I
10.1364/OE.21.012204
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Many kinds of subsurface defects are always present together in the subsurface of fused silica optics. It is imperfect that only one kind of defects is isolated to investigate its impact on laser damage. Therefore it is necessary to investigate the impact of subsurface defects on laser induced damage of fused silica optics with a comprehensive vision. In this work, we choose the fused silica samples manufactured by different vendors to characterize subsurface defects and measure laser induced damage. Contamination defects, subsurface damage (SSD), optical-thermal absorption and hardness of fused silica surface are characterized with time-of-flight secondary ion mass spectrometry (TOF-SIMS), fluorescence microscopy, photo-thermal common-path interferometer and fully automatic micro-hardness tester respectively. Laser induced damage threshold and damage density are measured by 351 nm nanosecond pulse laser. The correlations existing between defects and laser induced damage are analyzed. The results show that Cerium element and SSD both have a good correlation with laser-induced damage thresholds and damage density. Research results evaluate process technology of fused silica optics in China at present. Furthermore, the results can provide technique support for improving laser induced damage performance of fused silica. (C) 2013 Optical Society of America
引用
收藏
页码:12204 / 12217
页数:14
相关论文
共 23 条
[1]  
Andre M. L., 1996, P SOC PHOTO-OPT INS, V3047, P38
[2]   Quantitative depth profiling of ultra-shallow phosphorus implants in silicon using time-of-flight secondary ion mass spectrometry and the nuclear reaction 31P(α,p0)34S [J].
Bolorizadeh, MA ;
Ruffell, S ;
Mitchell, IV ;
Gwilliam, R .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2004, 225 (03) :345-352
[3]   Surface defect generation in optical materials under high fluence laser irradiation in vacuum [J].
Demos, SG ;
Burnham, A ;
Wegner, P ;
Norton, M ;
Zeller, L ;
Runkel, M ;
Kozlowski, MR ;
Staggs, M ;
Radousky, HB .
ELECTRONICS LETTERS, 2000, 36 (06) :566-567
[4]   Application of fluorescence microscopy for noninvasive detection of surface contamination and precursors to laser-induced damage [J].
Demos, SG ;
Staggs, M .
APPLIED OPTICS, 2002, 41 (10) :1977-1983
[5]   UV Transmission and radiation-induced defects in phosphate and fluoride-phosphate glasses [J].
Ehrt, D ;
Ebeling, P ;
Natura, U .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 2000, 263 (1-4) :240-250
[6]   iTIRM as a tool for qualifying polishing processes [J].
Fähnle, OW ;
Wons, T ;
Koch, E ;
Debruyne, S ;
Meeder, M ;
Booij, SM ;
Braat, JJM .
APPLIED OPTICS, 2002, 41 (19) :4036-4038
[7]   Role of light intensification by cracks in optical breakdown on surfaces [J].
Génin, FY ;
Salleo, A ;
Pistor, TV ;
Chase, LL .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 2001, 18 (10) :2607-2616
[8]   OPTICAL-GLASS FABRICATION TECHNOLOGY .2. RELATIONSHIP BETWEEN SURFACE-ROUGHNESS AND SUBSURFACE DAMAGE [J].
HED, PP ;
EDWARDS, DF .
APPLIED OPTICS, 1987, 26 (21) :4677-4680
[9]   Depth profiling of polishing-induced contamination on fused silica surfaces [J].
Kozlowski, MR ;
Carr, J ;
Hutcheon, I ;
Torres, R ;
Sheehan, L ;
Camp, D ;
Yan, M .
LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 1997, PROCEEDINGS, 1998, 3244 :365-375
[10]   A method for evaluating subsurface damage in optical glass [J].
Li, Yaguo ;
Huang, Hao ;
Xie, Ruiqing ;
Li, Haibo ;
Deng, Yan ;
Chen, Xianhua ;
Wang, Jian ;
Xu, Qiao ;
Yang, Wei ;
Guo, Yinbiao .
OPTICS EXPRESS, 2010, 18 (16) :17180-17186