A methodology to account for the finger interruptions in solar cell performance

被引：13

作者：

De Rose, R. ^{[1
,2
,3
]}

Malomo, A. ^{[3
]}

Magnone, P. ^{[1
,2
]}

Crupi, F. ^{[3
]}

Cellere, G. ^{[4
]}

Martire, M. ^{[4
]}

Tonini, D. ^{[4
]}

Sangiorgi, E. ^{[1
,2
]}

机构：

[1] Univ Bologna, ARCES DEIS, I-47521 Cesena, FC, Italy

[2] IUNET, I-47521 Cesena, FC, Italy

[3] Univ Calabria, DEIS, I-87036 Arcavacata Di Rende, CS, Italy

[4] Appl Mat Italia Srl, I-31048 Olmi Di S Biagio Di Call, TV, Italy

来源：

MICROELECTRONICS RELIABILITY | 2012年 / 52卷 / 9-10期

关键词：

Screen printing;

D O I：

10.1016/j.microrel.2012.07.014

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this work we propose a methodology based on a mixed-mode simulation approach to evaluate the impact of finger interruptions in the front-side metallization on the solar cell performance. We apply the proposed methodology to typical finger profiles realized with double screen-printing technology. The efficiency degradation induced by finger interruptions is studied as a function of interruption size, interruption position, number of interruptions and finger resistivity. (C) 2012 Elsevier Ltd. All rights reserved.

引用

页码：2500 / 2503

页数：4

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