Effect of Thermal Cycling on Commercial Thermoelectric Modules

被引:0
作者
Park, Woosung [1 ]
Barako, Michael T. [1 ]
Marconnet, Amy M. [1 ]
Asheghi, Mehdi [1 ]
Goodson, Kenneth E. [1 ]
机构
[1] Stanford Univ, Dept Mech Engn, Stanford, CA 94305 USA
来源
2012 13TH IEEE INTERSOCIETY CONFERENCE ON THERMAL AND THERMOMECHANICAL PHENOMENA IN ELECTRONIC SYSTEMS (ITHERM) | 2012年
关键词
thermoelectric modules; thermoelectric figure of merit; thermal cycling;
D O I
暂无
中图分类号
O414.1 [热力学];
学科分类号
摘要
The large temperature gradients experienced by thermoelectric modules induce significant thermal stresses which eventually lead to device failure. The impact of thermal cycling on a commercial thermoelectric module is investigated through characterization of the electrical properties. In this work, we measure the evolution of the thermoelectric and electrical properties with thermal cycling. One side of the thermoelectric module is cycled between 30 degrees C and 160 degrees C every 3 minutes while the other side is held at similar to 20 degrees C. The thermoelectric figure of merit, Z(TE)((T) over bar), and electrical resistivity are measured after every 1000 cycles. The measured Z(TE)((T) over bar) value is compared using both a modified Harman method and an electrical measurement technique analyzed with an electrical circuit model. In addition, the change in output power and resistivity with cycling are reported. This study provides insight into characterization methods for thermoelectric modules and quantifies reliability characteristics of thermoelectric modules.
引用
收藏
页码:107 / 112
页数:6
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