Autotune of PID temperature control based on closed-loop step response tests

A novel RID control autotune technique for temperature control systems operating in the cryogenic regime is described. The PID parameter tuning is based on a sequence of closed-loop step response tests utilizing the measured peak overshoot values and the time between the first peak and first dip of the step response. The performance of this technique is compared to that of a Ziegler-Nichols test. This empirically developed technique has proven to work well for certain types of cryogenic applications and we explore its potential for broader use.