Soft X-ray Imager aboard Hitomi (ASTRO-H)

被引：32

作者：

Tanaka, Takaaki ^{[1
]}

Uchida, Hiroyuki ^{[1
]}

Nakajima, Hiroshi ^{[2
]}

Tsunemi, Hiroshi ^{[2
]}

Hayashida, Kiyoshi

Tsuru, Takeshi Go ^{[1
]}

Dotani, Tadayasu ^{[3
]}

Nagino, Ryo

Inoue, Shota

Katada, Shuhei

Washino, Ryosaku ^{[1
]}

Ozaki, Masanobu ^{[3
]}

Tomida, Hiroshi ^{[3
]}

Natsukari, Chikara ^{[3
]}

Ueda, Shutaro ^{[3
]}

Iwai, Masachika ^{[3
]}

Mori, Koji ^{[4
]}

Yamauchi, Makoto ^{[4
]}

Hatsukade, Isamu ^{[4
]}

Nishioka, Yusuke ^{[4
]}

Isoda, Eri ^{[4
]}

Nobukawa, Masayoshi ^{[5
]}

Hiraga, Junko S. ^{[6
]}

Kohmura, Takayoshi ^{[7
]}

Murakami, Hiroshi ^{[8
]}

Nobukawa, Kumiko K. ^{[9
]}

Bamba, Aya ^{[10
]}

Doty, John P. ^{[11
]}

机构：

[1] Kyoto Univ, Dept Phys, Sakyo Ku, Kitashirakawa Oiwake Cho, Kyoto, Japan

[2] Osaka Univ, Dept Earth & Space Sci, Toyonaka, Osaka, Japan

[3] Inst Space & Astronaut Sci, JAXA, Chuo Ku, Sagamihara, Kanagawa, Japan

[4] Univ Miyazaki, Fac Engn, Miyazaki, Japan

[5] Nara Univ Educ, Fac Educ, Nara, Japan

[6] Kwansei Gakuin Univ, Dept Phys, Sanda, Hyogo, Japan

[7] Tokyo Univ Sci, Dept Phys, Noda, Chiba, Japan

[8] Tohoku Gakuin Univ, Dept Informat Sci, Izumi Ku, Sendai, Miyagi, Japan

[9] Nara Womens Univ, Dept Phys, Nara, Japan

[10] Univ Tokyo, Dept Phys, Bunkyo Ku, Tokyo, Japan

[11] Noqsi Aerosp Ltd, Pine, CO USA

来源：

JOURNAL OF ASTRONOMICAL TELESCOPES INSTRUMENTS AND SYSTEMS | 2018年 / 4卷 / 01期

关键词：

charge-coupled devices; x-rays; sensors; satellites; IN-ORBIT PERFORMANCE; CCD CAMERA; CHARGE-INJECTION; SXI ONBOARD;

D O I：

10.1117/1.JATIS.4.1.011211

中图分类号：

V [航空、航天];

学科分类号：

08 ; 0825 ;

摘要：

The Soft X-ray Imager (SXI) is an imaging spectrometer using charge-coupled devices (CCDs) aboard the Hitomi x-ray observatory. The SXI sensor has four CCDs with an imaging area size of 31 mm x 31 mm arranged in a 2 x 2 array. Combined with the x-ray mirror, the Soft X-ray Telescope, the SXI detects x-rays between 0.4 and 12 keV and covers a 380 x 380 field of view. The CCDs are P-channel fully depleted, back-illumination type with a depletion layer thickness of 200 mu m. Low operation temperature down to -120 degrees C as well as charge injection is employed to reduce the charge transfer inefficiency (CTI) of the CCDs. The functionality and performance of the SXI are verified in on-ground tests. The energy resolution measured is 161 to 170 eV in full width at half maximum for 5.9-keV x-rays. In the tests, we found that the CTI of some regions is significantly higher. A method is developed to properly treat the position-dependent CTI. Another problem we found is pinholes in the Al coating on the incident surface of the CCDs for optical light blocking. The Al thickness of the contamination blocking filter is increased to sufficiently block optical light. (c) The Authors. Published by SPIE under a Creative Commons Attribution 3.0 Unported License.

引用

页数：15

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