Effect of Eu Doping on the Structural, Electrical, and Dielectric Properties of K0.5Na0.5NbO3 Ceramics for High-Temperature Capacitor Applications

被引:11
作者
Zhang, Li-Hua [1 ,2 ]
Wang, Shu-Lin [1 ]
Liu, Fang-Hua [2 ]
机构
[1] Jiangsu Univ, Sch Mech Engn, Zhenjiang 212013, Jiangsu, Peoples R China
[2] Jiangsu Univ Sci & Technol, Sch Mech Engn, Zhenjiang 212003, Jiangsu, Peoples R China
基金
中国国家自然科学基金;
关键词
Potassium sodium niobate; dielectric properties; defects; capacitor; RELAXATION; CONDUCTION; TITANATE; SYSTEM; RANGE;
D O I
10.1007/s11664-015-3905-3
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The structural and dielectric properties of Eu-doped K0.5Na0.5NbO3 (KNN) ceramics were investigated as a potential candidate for use in high-temperature capacitors with working temperature beyond 200A degrees C. x-Ray diffraction results showed that tetragonal and cubic structure distortions occurred for low- and high-concentration doping, respectively. With increase of Eu content, the dielectric anomaly of the tetragonal-cubic transition was depressed and shifted to low temperature, while the temperature of the orthorhombic-tetragonal transition remained unchanged. A dielectric relaxation associated with oxygen vacancies was detected in the paraelectric phase region. The activation energy of oxygen vacancies depended on the Eu concentration and the defect compensation mechanism. KNN doped with 3 mol% Eu (KNN3Eu) showed good dielectric temperature stability (+/- 10%) with relatively high permittivity (> 1800 at 225A degrees C) over the temperature range from 119A degrees C to 495A degrees C, representing a good starting point for development of high-temperature capacitor materials.
引用
收藏
页码:3408 / 3414
页数:7
相关论文
共 22 条
[1]   Oxygen-vacancy-related low-frequency dielectric relaxation and electrical conduction in Bi:SrTiO3 [J].
Ang, C ;
Yu, Z ;
Cross, LE .
PHYSICAL REVIEW B, 2000, 62 (01) :228-236
[2]  
Bridger K., 2010, U.S. Patent, Patent No. [7697263 B2, 7697263]
[3]   Phase transitions and phase diagram of the ferroelectric perovskite (Na0.5Bi0.5)1-xBaxTiO3 by anelastic and dielectric measurements [J].
Cordero, F. ;
Craciun, F. ;
Trequattrini, F. ;
Mercadelli, E. ;
Galassi, C. .
PHYSICAL REVIEW B, 2010, 81 (14)
[4]   Lead-free high-temperature dielectrics with wide operational range [J].
Dittmer, Robert ;
Jo, Wook ;
Damjanovic, Dragan ;
Roedel, Juergen .
JOURNAL OF APPLIED PHYSICS, 2011, 109 (03)
[5]   IMPEDANCE AND DIELECTRIC-SPECTROSCOPY REVISITED - DISTINGUISHING LOCALIZED RELAXATION FROM LONG-RANGE CONDUCTIVITY [J].
GERHARDT, R .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1994, 55 (12) :1491-1506
[6]   The changing automotive environment: High-temperature electronics [J].
Johnson, RW ;
Evans, JL ;
Jacobsen, P ;
Thompson, JRR ;
Christopher, M .
IEEE TRANSACTIONS ON ELECTRONICS PACKAGING MANUFACTURING, 2004, 27 (03) :164-176
[7]   Dielectric relaxation in solids [J].
Jonscher, AK .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1999, 32 (14) :R57-R70
[8]   Diffuse dielectric anomaly in perovskite-type ferroelectric oxides in the temperature range of 400-700°C [J].
Kang, BS ;
Choi, SK ;
Park, CH .
JOURNAL OF APPLIED PHYSICS, 2003, 94 (03) :1904-1911
[9]   High-Temperature Dielectrics in the BiScO3-BaTiO3-(K1/2Bi1/2)TiO3 Ternary System [J].
Lim, Jong Bong ;
Zhang, Shujun ;
Kim, Namchul ;
Shrout, Thomas R. .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 2009, 92 (03) :679-682
[10]   Large strain response based on relaxor-antiferroelectric coherence in Bi0.5Na0.5TiO3-SrTiO3-(K0.5Na0.5)NbO3 solid solutions [J].
Liu, Laijun ;
Shi, Danping ;
Knapp, Michael ;
Ehrenberg, Helmut ;
Fang, Liang ;
Chen, Jun .
JOURNAL OF APPLIED PHYSICS, 2014, 116 (18)