Corrosion reliability of electronic devices

被引：1

作者：

Ambat, Rajan ^{[1
]}

机构：

[1] Tech Univ Denmark, Dept Mech Engn, DK-2800 Lyngby, Denmark

来源：

关键词：

D O I：

10.1179/1478422X13Z.000000000169

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：408 / 408

页数：1

共 50 条

[1] CORROSION OF ELECTRONIC MATERIALS AND DEVICES
FRANKENTHAL, RP
DENKI KAGAKU, 1994, 62 (02): : 128 - 134
[2] CORROSION OF ELECTRONIC MATERIALS AND DEVICES
COMIZZOLI, RB
FRANKENTHAL, RP
MILNER, PC
SINCLAIR, JD
SCIENCE, 1986, 234 (4774) : 340 - 345
[3] RELIABILITY EVALUATION OF ELECTRONIC DEVICES
KAWAI, S
NISHIMURA, A
HATTORI, T
KITANO, M
SHIMIZU, T
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 1991, 143 (1-2): : 247 - 256
[4] Electronic devices boost reliability
Mech Eng, 2 (78-79):
[5] Electronic devices boost reliability
Paula, G
MECHANICAL ENGINEERING, 1997, 119 (02) : 78 - 79
[6] PASSIVITY AND CORROSION OF ELECTRONIC MATERIALS AND DEVICES
FRANKENTHAL, RP
CORROSION SCIENCE, 1990, 31 : 59 - 68
[7] Corrosion of electronic and magnetic devices and materials
Frankel, GS
ELECTROCHEMICAL SYNTHESIS AND MODIFICATION OF MATERIALS, 1997, 451 : 541 - 548
[8] Reliability and failure of electronic materials and devices
Ohring, M
PHYSICS AND TECHNOLOGY OF THIN FILMS, 2004, : 171 - 179
[9] Climatic reliability of electronic devices and components
Ambat, R., 1600, PennWell Corporation (29):
[10] Accelerated reliability growth of electronic devices
Andonova, AS
Atanasova, NG
27th International Spring Seminar on Electronics Technology, Books 1-3, Conference Proceedings: MEETING THE CHALLENGES OF ELECTRONICS TECHNOLOGY PROGRESS, 2004, : 242 - 246