Imaging of Ti0.87O2 nanosheets using scanning tunneling spectroscopy

被引：6

作者：

Kumar, Avijit ^{[1
]}

Palanisamy, Suresh Kumar C. ^{[1
]}

Boter, Jelmer M. ^{[1
]}

Hellenthal, Chris ^{[1
]}

ten Elshof, Johan E. ^{[1
]}

Zandvliet, Harold J. W. ^{[1
]}

机构：

[1] Univ Twente, MESA Inst Nanotechnol, NL-7500 AE Enschede, Netherlands

来源：

APPLIED SURFACE SCIENCE | 2013年 / 265卷

关键词：

Scanning tunneling microscopy; Scanning tunneling spectroscopy; Ti0.87O2; nanosheets; THIN INSULATING FILM; SI(111)2X1 SURFACE; TITANIA NANOSHEETS; MICROSCOPY;

D O I：

10.1016/j.apsusc.2012.10.169

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We report scanning tunneling microscopy (STM) and spectroscopy (STS) measurements on single layer Ti0.87O2 nanosheets deposited on Pt(200 nm)/Si substrates. These nanosheets have a band gap of 3.8 eV and are virtually invisible in conventional STM images. However, an impressive contrast is observed in the di/dz map, which allows for a clear identification of the nanosheets. The di/dz signal is obtained by adding a high frequency, small amplitude modulation to the z-piezo using a lock-in amplifier. (C) 2012 Elsevier B.V. All rights reserved.

引用

页码：201 / 204

页数：4

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