The microwave power threshold for S-N transition of a thin HTSC film

被引:8
|
作者
Pukhov, AA
机构
[1] Sci. Ctr. Appl. Prob. E., Russian Academy of Sciences, Izhorskaya 13/19
关键词
D O I
10.1088/0953-2048/10/2/002
中图分类号
O59 [应用物理学];
学科分类号
摘要
Power-induced S-N switching of a thin HTSC film deposited onto a thermally stabilized dielectric substrate is studied theoretically. The absorption of microwave power in the film is calculated using a two-fluid model of a superconductor. The threshold character of the S-N transition related to the thermal nonlinearity of the film is analysed. The threshold microwave power P-p to switch the film is calculated. It is shown that the threshold power P-p is much less than that reported earlier. At P > P-p the S-N transition occurs by means of N-S interface propagation over the film. N-S interface propagation velocity v and energy of critical thermal perturbations E(c) initiating its propagation are estimated. The results obtained may be of importance in the study of S-N switching in superconducting MW devices.
引用
收藏
页码:82 / 84
页数:3
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