Prognostics and Health Monitoring of High Power LED

被引:31
作者
Sutharssan, Thamo [1 ]
Stoyanov, Stoyan [1 ]
Bailey, Chris [1 ]
Rosunally, Yasmine [1 ]
机构
[1] Univ Greenwich, Computat Mech & Reliabil Grp, Old Royal Naval Coll, London SE10 9LS, England
关键词
real-time health monitoring; data driven prognostics; high power LED; MAHALANOBIS DISTANCE; FUSION PROGNOSTICS; LIFE;
D O I
10.3390/mi3010078
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
Prognostics is seen as a key component of health usage monitoring systems, where prognostics algorithms can both detect anomalies in the behavior/performance of a micro-device/system, and predict its remaining useful life when subjected to monitored operational and environmental conditions. Light Emitting Diodes (LEDs) are optoelectronic micro-devices that are now replacing traditional incandescent and fluorescent lighting, as they have many advantages including higher reliability, greater energy efficiency, long life time and faster switching speed. For some LED applications there is a requirement to monitor the health of LED lighting systems and predict when failure is likely to occur. This is very important in the case of safety critical and emergency applications. This paper provides both experimental and theoretical results that demonstrate the use of prognostics and health monitoring techniques for high power LEDs subjected to harsh operating conditions.
引用
收藏
页码:78 / 100
页数:23
相关论文
共 40 条
  • [11] Byington C.S., 2004, P IEEE AER C BIG SKY, P1
  • [12] Celaya J.R., 2011, P ANN C PHM SOC, V3, P1
  • [13] Celaya J.R., 2010, Proc. Annu. Conf. Progn. Heal. Manag. Soc, P1
  • [14] Chang M.H., 2011, MICROELECTR IN PRESS
  • [15] Cheng SF, 2009, IEEE INT CON AUTO SC, P102, DOI 10.1109/COASE.2009.5234098
  • [16] Daigle M.J., 2011, IJPHM, V8, P1
  • [17] The Mahalanobis distance
    De Maesschalck, R
    Jouan-Rimbaud, D
    Massart, DL
    [J]. CHEMOMETRICS AND INTELLIGENT LABORATORY SYSTEMS, 2000, 50 (01) : 1 - 18
  • [18] Physics-of-Failure-Based Prognostics and Health Management for High-Power White Light-Emitting Diode Lighting
    Fan, Jiajie
    Yung, K. C.
    Pecht, Michael
    [J]. IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2011, 11 (03) : 407 - 416
  • [19] Goebel K, 2008, 62 M SOC MACH FAIL P, P119
  • [20] Guangfan Zhang, 2007, 2007 IEEE Aerospace Conference, P1, DOI 10.1109/ICEMI.2007.4350559