Wide-field, full-field optical coherence microscopy for high-axial-resolution phase and amplitude imaging

被引:18
作者
Federici, Antoine [1 ]
Gutierrez da Costa, Henrique S. [2 ]
Ogien, Jonas [1 ]
Ellerbee, Audrey K. [3 ,4 ]
Dubois, Arnaud [1 ]
机构
[1] Univ Paris 11, CNRS, Inst Opt, Lab Charles Fabry,UMR 8501, F-91127 Palaiseau, France
[2] Univ Fed Parana, Dept Informat, BR-81531970 Curitiba, Parana, Brazil
[3] Stanford Univ, EL Ginzton Lab, Stanford, CA 94305 USA
[4] Stanford Univ, Dept Elect Engn, Stanford, CA 94305 USA
关键词
THERMAL-LIGHT; SCANNING INTERFEROMETRY; THICKNESS-PROFILE; HIGH-SPEED; TOMOGRAPHY; TRANSPARENT; DOMAIN; CELLS; INTERFERENCE; REFLECTION;
D O I
10.1364/AO.54.008212
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
d An original single-objective, full-field optical coherence microscopy system is reported that is capable of imaging both the phase and the amplitude of semi-transparent samples over a field of view of 17.5 mm x 17.5 mm with an axial sectioning resolution of 1.5 mu m. A special stack acquisition arrangement ensures optimal reachable imaging depth. Several phase-shifting interferometry algorithms for phase measurement with broadband light are compared theoretically and experimentally. Using the phase information, noninvasive depth-resolved topographic images of multilayer samples are produced to characterize each layer by measuring their defects and curvature with a nanometric scale precision. Using the amplitude information, tomographic images with a constant detection sensitivity of similar to 80 dB through the entire field of view are obtained and applied to biological specimens. (C) 2015 Optical Society of America
引用
收藏
页码:8212 / 8220
页数:9
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