Electric transport in the phase-slip-free superconducting epitaxial Nb(Ti)N sub-micron structures

被引：1
作者：
Klimov, A. [1 ]
Slysz, W. [1 ]
Guziewicz, M. [1 ]
Kolkovsky, V [2 ]
Malinowski, A. [2 ]
Zaytseva, I [2 ]
Abaloszew, A. [2 ]
机构：
[1] Inst Electr Mat Technol, Al Lotnikow 32-46, PL-02668 Warsaw, Poland
[2] Polish Acad Sci, Inst Phys, Al Lotnikow 32-46, PL-02668 Warsaw, Poland
来源：
PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS | 2019年 / 560卷
关键词：
Superconducting ultra-thin Nb(Ti)N films; Vortex tunneling; Small area SNSPD; ULTRATHIN NBN; QUANTUM; FILMS;
D O I：
10.1016/j.physc.2019.02.005
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Measurements of the electrical transport properties of the phase-slip-free 100-nm-wide NbN superconducting nanostructured single photon detector (SNSPD) as a function of temperature and applied magnetic field are reported. The observed characteristics suggest Abrikosov vortices tunneling (flux creep) behavior at low temperatures and low voltages followed by flux flow regime at higher voltages and domination of this regime close to the critical temperature. It differs from the behavior of phase-slip-free 700-nm-wide NbTiN bridge structure of similar length where flux creep is followed by abrupt jump into highly resistive critical state.
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页码：7 / 9
页数：3
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