Origin of room-temperature photoluminescence around C-line in electron-irradiated Si and its applicability for quantification of carbon

被引:9
|
作者
Tajima, Michio [1 ]
Ishikawa, Yoichiro [1 ]
Kiuchi, Hirotatsu [1 ]
Ogura, Atsushi [1 ]
机构
[1] Meiji Univ, Kawasaki, Kanagawa 2148571, Japan
关键词
SILICON; LUMINESCENCE; OXYGEN; SPECTROSCOPY; DEFECTS; STRESS;
D O I
10.7567/APEX.11.041301
中图分类号
O59 [应用物理学];
学科分类号
摘要
We demonstrate that a broad emission band is observable at room temperature in the vicinity of the carbon-related C-line detected at cryogenic temperatures in electron-irradiated Si. Its spectral shape is different from similar shapes of the bands due to dislocations, oxygen precipitates, and thermal donors. The band is annealed out at 450 degrees C and its intensity ratio to the band-edge emission has a positive correlation with carbon concentration in the same manner as the C-line. We deduce that the band has a very similar origin to the C-line and discuss the possibility of carbon quantification by using the ratio as an index. (C) 2018 The Japan Society of Applied Physics
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页数:5
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