Quantum size effect across semiconductor-to-metal phase transition in vanadium dioxide thin films

被引:14
作者
Khan, G. R. [1 ]
Bhat, B. A. [1 ]
机构
[1] Natl Inst Technol, Dept Phys, Nanotechnol Res Lab, Srinagar 19006, Kashmir, India
关键词
size effect; electrical conductivity transitions; vanadium compounds; semiconductor thin films; Rutherford backscattering; X-ray diffraction; scanning electron microscopy; ultraviolet spectra; visible spectra; surface morphology; spectral line shift; quantum size effect; semiconductor-metal phase transition; vanadium dioxide thin films; phase transition temperature; microscale dimensions; nanoscale dimensions; structural properties; optical properties; electrical properties; nanothin films; microthin films; glass substrates; inorganic sol-gel route; Rutherford backscattering spectrometry; X-ray diffractometery; ultraviolet-visible spectroscopy; four-probe method; layer thickness; polycrystalline films; 011] orientation; regular crystallites; irregular crystallites; cuboidal surface morphology; crystallite size; blue shift; maximum absorption; optical bandgaps; metal-semiconductor transition temperatures; temperature 293 K to 298 K; VO2; SiO2; SOL-GEL PROCESS; VO2; HYSTERESIS; TEMPERATURE; FABRICATION; COATINGS; MO;
D O I
10.1049/mnl.2015.0213
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The phase transition temperature of vanadium dioxide (VO2) thin films shifts to the vicinity of room temperature by reducing the dimensions from microscale to nanoscale without the use of any dopant. This quantum size effect elucidated by studying the structural, optical and electrical properties of nanothin and microthin films of VO2 across their semiconductor-metal phase transitions has been demonstrated in this reported work. The films fabricated on glass substrates via the inorganic sol-gel route were characterised by Rutherford backscattering spectrometry (RBS), X-ray diffractometery, scanning electron microscopy, ultraviolet-visible spectroscopy and the four-probe method. The RBS results estimate a layer thickness of 15 and 291 nm for nanothin and microthin films, respectively. The films were polycrystalline in their nature of [011] orientation with regular and irregular crystallites of a cuboidal surface morphology. Estimation of crystallite size revealed that nanothin films attain poor crystallinity as compared with microthin films. The blue shift was observed in nanothin films from microthin films as maximum absorption occurred at wavelengths of 360 and 443 nm, respectively. Optical bandgaps of 2.3 and 1.87 eV were found for nanothin and microthin films, respectively. Depletion in metal-to-semiconductor and semiconductor-to-metal transition temperatures were experienced from higher temperature regimes of 341 and 335 K for microthin films to lower temperature regimes of 319 and 305 K for nanothin films, respectively.
引用
收藏
页码:607 / 612
页数:6
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