Experimental Determination of Relation Between Helical Anisotropy and Torsion Stress in Amorphous Magnetic Microwires

被引：3

作者：

Chizhik, Alexander ^{[1
]}

Zhukov, Arcady ^{[1
]}

Blanco, Juan Mari ^{[2
]}

Gonzalez, Julian ^{[1
]}

Gawronski, Przemyslaw ^{[3
]}

Kulakowski, Krzysztof ^{[3
]}

机构：

[1] Univ Basque Country, Fac Quim, Dept Fis Mat, E-20080 San Sebastian, Spain

[2] Univ Basque Country, EUPDS, Dept Fis Aplicada 1, San Sebastian 20018, Spain

[3] AGH Univ Sci & Technol, Fac Phys & Appl Comp Sci, PL-30059 Krakow, Poland

来源：

IEEE TRANSACTIONS ON MAGNETICS | 2008年 / 44卷 / 11期

关键词：

Amorphous magnetic wires; hysteresis; magnetooptic Kerr effect; Torsion stress;

D O I：

10.1109/TMAG.2008.2001514

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Surface magnetization reversal of Co-rich amorphous glass covered microwires in the presence of torsion stress has been studied by magneto-optical Kerr effect. The dependence of the angle of the helical anisotropy on the applied torsion stress has been obtained for the first time based on the analysis of the magneto-optical experimental results. The value of the limit angle of the torsion stress induced helical anisotropy has been found.

引用

页码：3938 / 3941

页数：4

共 12 条

[1]

Bertotti G., 1998, Hysteresis in Magnetism: For Physicists, Materials Scientists, and Engineers

[2] Circular magnetic bistability induced by tensile stress in glass-covered amorphous microwires [J].