A Light-Field Metasurface for High-Resolution Single-Particle Tracking

被引：55

作者：

Holsteen, Aaron L. ^{[1
]}

Lin, Dianmin ^{[1
,2
]}

Kauvar, Isaac ^{[2
]}

Wetzstein, Gordon ^{[2
]}

Brongersma, Mark L. ^{[1
]}

机构：

[1] Stanford Univ, Geballe Lab Adv Mat, Stanford, CA 94305 USA

[2] Stanford Univ, Dept Elect Engn, Stanford, CA 94305 USA

来源：

NANO LETTERS | 2019年 / 19卷 / 04期

关键词：

Light-field metasurface; interleaved metasurface; single-particle tracking; Mie resonance; microlens array; point spread function engineering; DIELECTRIC METASURFACES; PHASE; POLARIZATION; MICROSCOPY; GRATINGS;

D O I：

10.1021/acs.nanolett.8b04673

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Three-dimensional (3D) single-particle tracking (SPT) is a key tool for studying dynamic processes in the life sciences. However, conventional optical elements utilizing light fields impose an inherent trade-off between lateral and axial resolution, preventing SPT with high spatiotemporal resolution across an extended volume. We overcome the typical loss in spatial resolution that accompanies light-field-based approaches to obtain 3D information by placing a standard microscope coverslip patterned with a multifunctional, light-field metasurface on a specimen. This approach enables an otherwise unmodified microscope to gather 3D information at an enhanced spatial resolution. We demonstrate simultaneous tracking of multiple fluorescent particles within a large 0.5 x 0.5 x 0.3 mm(3) volume using a standard epi-fluorescent microscope with submicron lateral and micron-level axial resolution.

引用

页码：2267 / 2271

页数：5

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