Stability of field emission current from various types of carbon nanotube films

被引：21

作者：

Ulmen, B ^{[1
]}

Kayastha, VK ^{[1
]}

DeConinck, A ^{[1
]}

Wang, JS ^{[1
]}

Yap, YK ^{[1
]}

机构：

[1] Michigan Technol Univ, Dept Phys, Houghton, MI 49931 USA

来源：

关键词：

display technologies; field emission; nanotubes defects;

D O I：

10.1016/j.diamond.2005.08.040

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A series of emission Current measurements were taken from various types of multiwalled carbon nanotube (MWCNT) films in order to examine their stability for electron field emission. We found that the MWCNTs films grown by the catalytic thermal chemical vapor deposition (CVD) method exhibited much improved emission stability as compared to MWCNT films grown by the plasma-enhanced CVD (PECVD) method. We explain this difference of performance by referring to the graphitic order of these MWCNTs as detected by transmission electron microscopy and Raman spectroscopy. Results indicate that MWCNTs with high-order tubular structures demonstrate stable electron field emission. The best performing sample exhibits a constant current degradation of similar to 3% per hour at an emission current density of similar to 1 mJ/cm(2) (c) 2005 Elsevier B.V. All rights reserved.

引用

页码：212 / 216

页数：5

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